Scanning tunneling potentiometry implemented into a multi-tip setup by software

被引：23

作者：

Luepke, F. ^{[1
]}

Korte, S. ^{[1
]}

Cherepanov, V. ^{[1
]}

Voigtlaender, B. ^{[1
]}

机构：

[1] Forschungszentrum Julich, Peter Grunberg Inst PGI 3, D-52425 Julich, Germany

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2015年 / 86卷 / 12期

关键词：

MICROSCOPE; GRAPHENE;

D O I：

10.1063/1.4936079

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present a multi-tip scanning tunneling potentiometry technique that can be implemented into existing multi-tip scanning tunneling microscopes without installation of additional hardware. The resulting setup allows flexible in situ contacting of samples under UHV conditions and subsequent measurement of the sample topography and local electric potential with resolution down to angstrom and mu V, respectively. The performance of the potentiometry feedback is demonstrated by thermovoltage measurements on the Ag/Si(111) - (root 3 x root 3)R30 degrees surface by resolving a standing wave pattern. Subsequently, the ability to map the local transport field as a result of a lateral current through the sample surface is shown on Ag/Si(111) - (root 3 x root 3)R30 degrees and Si(111) - (7 x 7) surfaces. (C) 2015 AIP Publishing LLC.

引用

页数：7

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