Nano-scale Strain Mapping using Near-field Spectroscopy

被引：0
|
作者：
Llopis, A. [1 ]
Pereira, S. M. S. [2 ]
Watson, I. M. [3 ]
Krokhin, A. A. [1 ]
Neogi, A. [1 ]
机构：
[1] Univ N Texas, Dept Phys, POB 311427, Denton, TX 76203 USA
[2] Univ Aveiro, CICECO, P-3810193 Aveiro, Portugal
[3] Univ Strathclyde, Inst Photon, Glasgow, Lanark, Scotland
来源：
2011 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2011年
关键词：
QUANTUM-WELLS;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A technique is presented for mapping the strain in light-emitting nano-and hetero-structures using near-field spectroscopy. This technique makes use of theoretical calculations to extract the strain from near-field data.
引用
收藏
页数：2
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