Nano-scale Strain Mapping using Near-field Spectroscopy

被引：0

作者：

Llopis, A. ^{[1
]}

Pereira, S. M. S. ^{[2
]}

Watson, I. M. ^{[3
]}

Krokhin, A. A. ^{[1
]}

Neogi, A. ^{[1
]}

机构：

[1] Univ N Texas, Dept Phys, POB 311427, Denton, TX 76203 USA

[2] Univ Aveiro, CICECO, P-3810193 Aveiro, Portugal

[3] Univ Strathclyde, Inst Photon, Glasgow, Lanark, Scotland

来源：

2011 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2011年

关键词：

QUANTUM-WELLS;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A technique is presented for mapping the strain in light-emitting nano-and hetero-structures using near-field spectroscopy. This technique makes use of theoretical calculations to extract the strain from near-field data.

引用

页数：2

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