Mapping mechanical properties on the nanoscale using atomic-force acoustic microscopy

Tools are being developed that use the atomic-force microscope (AFM) to measure mechanical properties with nanoscale spatial resolution. Contact-resonance-spectroscopy techniques such as atomic-force acoustic microscopy involve the vibrational modes of the AFM cantilever when its tip is in contact with a material. These methods enable quantitative maps of local mechanical properties such as elastic modulus and thin-film adhesion. The information obtained furthers the understanding of patterned surfaces, thin films, and nanoscale structures.