共 30 条
[2]
Arik M, 2002, IEEE 8 INT C THERM T, P113
[3]
Biber C, 2008, P IEEE SEMICOND THER, P182
[9]
Thermal investigation of high power optical devices by transient testing
[J].
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES,
2005, 28 (01)
:45-50