3D Packaging with Through Silicon Via (TSV) for Electrical and Fluidic Interconnections

被引:11
|
作者
Khan, Navas [1 ]
Yu, Li Hong [1 ]
Pin, Tan Siow [1 ,2 ]
Ho, Soon Wee [1 ]
Su, Nandar [1 ]
Hnin, Wai Yin [1 ]
Kripesh, Vaidyanathan [1 ]
Pinjala [1 ]
Lau, John H. [1 ,3 ]
Chuan, Toh Kok [2 ]
机构
[1] ASTAR, Inst Microelect, 11 Sci Pk Rd,Sci Pk 2, Singapore 117585, Singapore
[2] Nanyang Technol Univ, Temasek Labs, Singapore 637553, Singapore
[3] Ind Technol Res Inst, Hsinchu 31040, Taiwan
来源
2009 IEEE 59TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, VOLS 1-4 | 2009年
关键词
D O I
10.1109/ECTC.2009.5074157
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper a liquid cooling solution has been reported for 3-D package in PoP format. The high heat dissipating chip is mounted on a silicon carrier, which has copper through-silicon via for electrical interconnection and through-silicon hollow via for fluidic circulation. Heat enhancement structures have been embedded in the chip carrier. Cooling liquid, de-ionized water is circulated through the chip carrier and heat from the chip is extracted. The fluidic channels are isolated from electrical traces using hermetic sealing. The research work has demonstrated 100 W of heat dissipation from one stack and total of 200 W from two stacks of the package. The fluidic interconnections and sealing techniques have been discussed.
引用
收藏
页码:1153 / +
页数:2
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