共 50 条
- [1] 3-D Packaging With Through-Silicon Via (TSV) for Electrical and Fluidic InterconnectionsIEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2013, 3 (02): : 221 - 228Khan, Navas论文数: 0 引用数: 0 h-index: 0机构: Agcy Sci Technol & Res, Inst Microelect, Singapore 117585, Singapore Agcy Sci Technol & Res, Inst Microelect, Singapore 117585, SingaporeYu, Li Hong论文数: 0 引用数: 0 h-index: 0机构: Agcy Sci Technol & Res, Inst Microelect, Singapore 117585, Singapore Agcy Sci Technol & Res, Inst Microelect, Singapore 117585, SingaporePin, Tan Siow论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Temasek Labs, Singapore 637553, Singapore Agcy Sci Technol & Res, Inst Microelect, Singapore 117585, SingaporeHo, Soon Wee论文数: 0 引用数: 0 h-index: 0机构: Agcy Sci Technol & Res, Inst Microelect, Singapore 117585, Singapore Agcy Sci Technol & Res, Inst Microelect, Singapore 117585, SingaporeKripesh, Vaidyanathan论文数: 0 引用数: 0 h-index: 0机构: Agcy Sci Technol & Res, Inst Microelect, Singapore 117585, Singapore Agcy Sci Technol & Res, Inst Microelect, Singapore 117585, SingaporePinjala, Damaruganath论文数: 0 引用数: 0 h-index: 0机构: Agcy Sci Technol & Res, Inst Microelect, Singapore 117585, Singapore Agcy Sci Technol & Res, Inst Microelect, Singapore 117585, SingaporeLau, John H.论文数: 0 引用数: 0 h-index: 0机构: Agcy Sci Technol & Res, Inst Microelect, Singapore 117585, Singapore Ind Technol Res Inst, Hsinchu 31040, Taiwan Agcy Sci Technol & Res, Inst Microelect, Singapore 117585, SingaporeChuan, Toh Kok论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Temasek Labs, Singapore 637553, Singapore Agcy Sci Technol & Res, Inst Microelect, Singapore 117585, Singapore
- [2] 3D Modeling and Electrical Characteristics of Through-Silicon-Via (TSV) in 3D Integrated Circuits2011 12TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY AND HIGH DENSITY PACKAGING (ICEPT-HDP), 2011, : 471 - 475Liang, Lei论文数: 0 引用数: 0 h-index: 0机构: Beijing Informat Sci & Technol Univ, Informat Microsyst Inst, Beijing 100101, Peoples R China Beijing Informat Sci & Technol Univ, Informat Microsyst Inst, Beijing 100101, Peoples R ChinaMiao, Min论文数: 0 引用数: 0 h-index: 0机构: Beijing Informat Sci & Technol Univ, Informat Microsyst Inst, Beijing 100101, Peoples R China Beijing Informat Sci & Technol Univ, Informat Microsyst Inst, Beijing 100101, Peoples R ChinaLi, Zhensong论文数: 0 引用数: 0 h-index: 0机构: Beijing Informat Sci & Technol Univ, Informat Microsyst Inst, Beijing 100101, Peoples R China Beijing Informat Sci & Technol Univ, Informat Microsyst Inst, Beijing 100101, Peoples R ChinaXu, Shufang论文数: 0 引用数: 0 h-index: 0机构: Beijing Informat Sci & Technol Univ, Informat Microsyst Inst, Beijing 100101, Peoples R China Beijing Informat Sci & Technol Univ, Informat Microsyst Inst, Beijing 100101, Peoples R ChinaZhang, Yuexia论文数: 0 引用数: 0 h-index: 0机构: Beijing Informat Sci & Technol Univ, Informat Microsyst Inst, Beijing 100101, Peoples R China Beijing Informat Sci & Technol Univ, Informat Microsyst Inst, Beijing 100101, Peoples R ChinaZhang, Xiaoqing论文数: 0 引用数: 0 h-index: 0机构: Beijing Informat Sci & Technol Univ, Informat Microsyst Inst, Beijing 100101, Peoples R China Beijing Informat Sci & Technol Univ, Informat Microsyst Inst, Beijing 100101, Peoples R China
- [3] Conductive interconnections through thick silicon substrates for 3D packagingFIFTEENTH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST, 2002, : 388 - 391Takizawa, T论文数: 0 引用数: 0 h-index: 0机构: Fujikura Ltd, Electron Device Lab, Tokyo 1358512, Japan Fujikura Ltd, Electron Device Lab, Tokyo 1358512, JapanYamamoto, S论文数: 0 引用数: 0 h-index: 0机构: Fujikura Ltd, Electron Device Lab, Tokyo 1358512, Japan Fujikura Ltd, Electron Device Lab, Tokyo 1358512, JapanItoi, K论文数: 0 引用数: 0 h-index: 0机构: Fujikura Ltd, Electron Device Lab, Tokyo 1358512, Japan Fujikura Ltd, Electron Device Lab, Tokyo 1358512, JapanSuemasu, T论文数: 0 引用数: 0 h-index: 0机构: Fujikura Ltd, Electron Device Lab, Tokyo 1358512, Japan Fujikura Ltd, Electron Device Lab, Tokyo 1358512, Japan
- [4] Copper Through Silicon Via (TSV) for 3D integration2012 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2012,Kothandaraman, C.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USAHimmel, B.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USASafran, J.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USAGolz, J.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USAMaier, G.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USAFarooq, M. G.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USAGraves-Abe, T.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USALanders, W.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USAVolant, R.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USAPetrarca, K.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USAChen, F.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USASullivan, T. D.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USALaRosa, G.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USARobson, N.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USAHannon, R.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USAIyer, S. S.论文数: 0 引用数: 0 h-index: 0机构: IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA IBM Corp, Semicond Res & Dev Ctr SRDC, Syst & Technol Grp, Hopewell Jct, NY 12533 USA
- [5] Electrical Testing of Blind Through-Silicon Via (TSV) for 3D IC Integration2012 IEEE 62ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2012, : 564 - 570Hung, Jui-Feng论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, TaiwanLau, John H.论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, TaiwanChen, Peng-Shu论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, TaiwanWu, Shih-Hsien论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, TaiwanLai, Shinn-Juh论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, TaiwanLi, Ming-Lin论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, TaiwanSheu, Shyh-Shyuan论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, TaiwanTzeng, Pei-Jer论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, TaiwanLin, Zhe-Hui论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, TaiwanKu, Tzu-Kun论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, TaiwanLo, Wei-Chung论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, TaiwanKao, Ming-Jer论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Lab, Hsinchu 310, Taiwan
- [6] Effects of TSV (Through Silicon Via) Interposer/Chip on the Thermal Performances of 3D IC PackagingIPACK 2009: PROCEEDINGS OF THE ASME INTERPACK CONFERENCE 2009, VOL 1, 2010, : 67 - 74Lau, John H.论文数: 0 引用数: 0 h-index: 0机构: Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R China Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R ChinaYue, Tang Gong论文数: 0 引用数: 0 h-index: 0机构: Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R China Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R ChinaHoe, Germaine Yen Yi论文数: 0 引用数: 0 h-index: 0机构: Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R China Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R ChinaWu, Zhang Xiao论文数: 0 引用数: 0 h-index: 0机构: Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R China Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R ChinaChong, Chai Tai论文数: 0 引用数: 0 h-index: 0机构: Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R China Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R ChinaDamaruganath, Pinjala论文数: 0 引用数: 0 h-index: 0机构: Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R China Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R ChinaVaidyanathan, Kripesh论文数: 0 引用数: 0 h-index: 0机构: Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R China Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R China
- [7] Electrical transmission characteristics of differential TSV structures in 3D TSV Packaging2015 IEEE 17TH ELECTRONICS PACKAGING AND TECHNOLOGY CONFERENCE (EPTC), 2015,Meng Zhen论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, 3 Beitucheng West Rd, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, 3 Beitucheng West Rd, Beijing 100029, Peoples R ChinaYan Yuepeng论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, 3 Beitucheng West Rd, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, 3 Beitucheng West Rd, Beijing 100029, Peoples R ChinaWang Chen论文数: 0 引用数: 0 h-index: 0机构: Minist Environm Protect, Satellite Environm Ctr, Beijing 100094, Peoples R China Chinese Acad Sci, Inst Microelect, 3 Beitucheng West Rd, Beijing 100029, Peoples R ChinaZhang Xingcheng论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, 3 Beitucheng West Rd, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, 3 Beitucheng West Rd, Beijing 100029, Peoples R ChinaLiu Mou论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, 3 Beitucheng West Rd, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, 3 Beitucheng West Rd, Beijing 100029, Peoples R China
- [8] Development of 3D silicon module with TSV for system in packaging58TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, PROCEEDINGS, 2008, : 550 - +Khan, Navas论文数: 0 引用数: 0 h-index: 0机构: Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, Singapore Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, SingaporeRao, Vempati Srinivasa论文数: 0 引用数: 0 h-index: 0机构: Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, Singapore Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, SingaporeLim, Samule论文数: 0 引用数: 0 h-index: 0机构: Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, Singapore Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, SingaporeWe, Ho Soon论文数: 0 引用数: 0 h-index: 0机构: Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, Singapore Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, SingaporeLee, Vincent论文数: 0 引用数: 0 h-index: 0机构: Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, Singapore Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, SingaporeWu, Zhang Xiao论文数: 0 引用数: 0 h-index: 0机构: Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, Singapore Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, SingaporeRui, Yang论文数: 0 引用数: 0 h-index: 0机构: Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, Singapore Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, SingaporeEbin, Liao论文数: 0 引用数: 0 h-index: 0机构: Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, Singapore Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, SingaporeChai, T. C.论文数: 0 引用数: 0 h-index: 0机构: Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, Singapore Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, SingaporeKripesh, V.论文数: 0 引用数: 0 h-index: 0机构: Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, Singapore Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, SingaporeLau, John论文数: 0 引用数: 0 h-index: 0机构: Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, Singapore Inst Microelect IME, 11 Sci Pk Rd,Singapore Sci Pk 2, Singapore 117685, Singapore
- [9] Post TSV Etch Cleaning Process Development using SAPS Megasonic Technology 3D/TSV/ Interposer: Through Silicon Via and Packaging2015 26TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC), 2015, : 201 - 203Chen, Fuping论文数: 0 引用数: 0 h-index: 0机构: ACM Res Inc, 42307 Osgood Rd Suite 1, Fremont, CA 94539 USA ACM Res Inc, 42307 Osgood Rd Suite 1, Fremont, CA 94539 USAZhang, Xiaoyan论文数: 0 引用数: 0 h-index: 0机构: ACM Res Inc, 42307 Osgood Rd Suite 1, Fremont, CA 94539 USA ACM Res Inc, 42307 Osgood Rd Suite 1, Fremont, CA 94539 USAWang, Xi论文数: 0 引用数: 0 h-index: 0机构: ACM Res Inc, 42307 Osgood Rd Suite 1, Fremont, CA 94539 USA ACM Res Inc, 42307 Osgood Rd Suite 1, Fremont, CA 94539 USATao, Xuecheng论文数: 0 引用数: 0 h-index: 0机构: ACM Res Inc, 42307 Osgood Rd Suite 1, Fremont, CA 94539 USA ACM Res Inc, 42307 Osgood Rd Suite 1, Fremont, CA 94539 USAYang, Shu论文数: 0 引用数: 0 h-index: 0机构: ACM Res Inc, 42307 Osgood Rd Suite 1, Fremont, CA 94539 USA ACM Res Inc, 42307 Osgood Rd Suite 1, Fremont, CA 94539 USAWang, David H.论文数: 0 引用数: 0 h-index: 0机构: ACM Res Inc, 42307 Osgood Rd Suite 1, Fremont, CA 94539 USA ACM Res Inc, 42307 Osgood Rd Suite 1, Fremont, CA 94539 USAVartanian, Victor论文数: 0 引用数: 0 h-index: 0机构: SEMATECH, Albany, NY 12203 USA ACM Res Inc, 42307 Osgood Rd Suite 1, Fremont, CA 94539 USASapp, Brian论文数: 0 引用数: 0 h-index: 0机构: SEMATECH, Albany, NY 12203 USA ACM Res Inc, 42307 Osgood Rd Suite 1, Fremont, CA 94539 USA
- [10] Modeling and Analysis of Cracked Through Silicon Via (TSV) InterconnectionsPROCEEDINGS OF THE 2014 IEEE 17TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS), 2014, : 310 - 313Gerakis, Vasileios论文数: 0 引用数: 0 h-index: 0机构: Aristotle Univ Thessaloniki, Dept Elect & Comp Engn, Thessaloniki, Greece Aristotle Univ Thessaloniki, Dept Elect & Comp Engn, Thessaloniki, GreeceAvdikou, Christina论文数: 0 引用数: 0 h-index: 0机构: Aristotle Univ Thessaloniki, Dept Elect & Comp Engn, Thessaloniki, Greece Aristotle Univ Thessaloniki, Dept Elect & Comp Engn, Thessaloniki, GreeceLiolios, Alexandros论文数: 0 引用数: 0 h-index: 0机构: Aristotle Univ Thessaloniki, Dept Elect & Comp Engn, Thessaloniki, Greece Aristotle Univ Thessaloniki, Dept Elect & Comp Engn, Thessaloniki, GreeceHatzopoulos, Alkis论文数: 0 引用数: 0 h-index: 0机构: Aristotle Univ Thessaloniki, Dept Elect & Comp Engn, Thessaloniki, Greece Aristotle Univ Thessaloniki, Dept Elect & Comp Engn, Thessaloniki, Greece