Differential Phase Contrast in Scanning X-ray Microscopy with Half-wavelength Phase Shifter

被引：0

作者：

Suzuki, Yoshio ^{[1
]}

Takeuchi, Akihisa ^{[1
]}

机构：

[1] Japan Synchrotron Radiat Res Inst JASRI SPring 8, Sayo, Hyogo 6795198, Japan

来源：

XRM 2014: PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY | 2016年 / 1696卷

关键词：

DETECTOR;

D O I：

10.1063/1.4937508

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A method for differential-phase-contrast imaging in scanning x-ray microscopy is proposed. The microfocus beam is produced with an x-ray focusing optics, and a half of the optical aperture is masked with a lambda/2 phase shifter. This generates a pair of focused beam at the focal plane, with p phase difference. Combining with a diaphragm in front of the transmission beam detector, differential phase contrast (contrast proportional to the phase-difference between two foci) can be obtained. Preliminary results with a Fresnel zone plate focusing optics at 12.4 keV x-ray energy are shown.

引用

页数：4

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