Implementation and optimization of a scanning Joule expansion microscope for the study of small conducting gold wires

被引：9

作者：

Cannaerts, M ^{[1
]}

Seynaeve, E ^{[1
]}

Rens, G ^{[1
]}

Volodin, A ^{[1
]}

Van Haesendonck, C ^{[1
]}

机构：

[1] Katholieke Univ Leuven, Vaste Stof Fys Magnetisme Lab, B-3001 Louvain, Belgium

来源：

APPLIED SURFACE SCIENCE | 2000年 / 157卷 / 04期

关键词：

AFM; SJEM; SThM; thermal diffusion; thermal expansion;

D O I：

10.1016/S0169-4332(99)00544-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

In order to study heating phenomena with submicrometer spatial resolution, we have implemented a scanning Joule expansion microscope (SJEM). When compared to scanning thermal microscopy (SThM), which requires the microfabrication of thermal probes, SJEM has superior spatial resolution and can be implemented more easily since no special tips or cantilevers have to be fabricated. Our SJEM measurements on small gold wires reveal that electrostatic force interactions between sample and tip can strongly affect the SJEM images. Therefore, we have identified the relevant parameters, in particular the cantilever stiffness, which have to be optimized to obtain reliable results. The temperature profile in the gold wires can be fitted to theoretical model calculations. (C) 2000 Published by Elsevier Science B.V. All rights reserved.

引用

页码：308 / 313

页数：6

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