Phenomenological analysis of domain width in rhombohedral BiFeO3 films

被引：28

作者：

Huang, C. W. ^{[1
]}

Chen, Lang ^{[1
]}

Wang, J. ^{[1
]}

He, Q. ^{[2
]}

Yang, S. Y. ^{[2
]}

Chu, Y. H. ^{[3
]}

Ramesh, R. ^{[2
]}

机构：

[1] Nanyang Technol Univ, Sch Mat Sci & Engn, Singapore 639798, Singapore

[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

[3] Natl Chiao Tung Univ, Dept Mat Sci & Engn, Hsinchu 30013, Taiwan

来源：

PHYSICAL REVIEW B | 2009年 / 80卷 / 14期

关键词：

THIN FERROELECTRIC-FILMS; PATTERN; ENERGY;

D O I：

10.1103/PhysRevB.80.140101

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The experimental domain size scaling law in epitaxial BiFeO3 films shows a different behavior from predictions of the conventional elastic domains: the (101)-type 71 degrees domains are much wider than that of (100)-type 109 degrees despite the larger domain-wall energy in (100) boundary. A phenomenological analysis for rhombohedral BiFeO3 film is proposed, and it reveals that both the depolarizing energy and the elastic energy are indispensable for the equilibrium domain structures. With the increase in the asymmetrical electrostatic boundary on the film surfaces, the dominant domain scaling mechanism changes from electrostatic-dependent domain structure to elastic-dependent one, which is consistent with the experimental data. The present results highlight the general role of depolarizing field in rhombohedral domain structures.

引用

页数：4

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