Resolving the geometrically necessary dislocation content by conventional electron backscattering diffraction

被引：670
作者：
Pantleon, W. [1 ]
机构：
[1] Tech Univ Denmark, Riso Natl Lab, Dept Mat Res, Ctr Fundamental Res Met Struct Dimens 4, DK-4000 Roskilde, Denmark
来源：
SCRIPTA MATERIALIA | 2008年 / 58卷 / 11期
关键词：
microstructure; dislocation structure; electron backscattering diffraction (EBSD); disorientation;
D O I：
10.1016/j.scriptamat.2008.01.050
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
From local orientation measurements on planar surfaces by means of electron backscattering diffraction, six components of the lattice curvature tensor can be identified. They allow determination of five components of the dislocation density tensor (thus two more than hitherto reported) and, additionally, one difference between two other components. With this information improved lower bounds for the geometrically necessary dislocation content are obtained by linear optimization. (c) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码：994 / 997
页数：4
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