Radiation-Induced Premelting of Ice at Silica Interfaces

被引：21

作者：

Schoeder, S. ^{[1
,2
]}

Reichert, H. ^{[1
]}

Schroeder, H. ^{[1
]}

Mezger, M. ^{[1
]}

Okasinski, J. S. ^{[1
]}

Honkimaeki, V. ^{[2
]}

Bilgram, J. ^{[3
]}

Dosch, H. ^{[1
]}

机构：

[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany

[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France

[3] ETH, Festkorperphys Lab, CH-8093 Zurich, Switzerland

来源：

PHYSICAL REVIEW LETTERS | 2009年 / 103卷 / 09期

关键词：

DENSITY AMORPHOUS ICE; SINGLE-CRYSTALS; SURFACE; CONSEQUENCES; IRRADIATION; TRANSITION; LAYER;

D O I：

10.1103/PhysRevLett.103.095502

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The existence of surface and interfacial melting of ice below 0 degrees C has been confirmed by many different experimental techniques. Here we present a high-energy x-ray reflectivity study of the interfacial melting of ice as a function of both temperature and x-ray irradiation dose. We found a clear increase of the thickness of the quasiliquid layer with the irradiation dose. By a systematic x-ray study, we have been able to unambiguously disentangle thermal and radiation-induced premelting phenomena. We also confirm the previously announced very high water density (1.25 g/cm(3)) within the emerging quasiliquid layer.

引用

页数：4

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