The dependence of the emission from MQWs on the indium content in the underlying InGaN templates: experimental and modeling results

被引:8
作者
Abdelhamid, Mostafa [1 ]
Routh, Evyn L. [2 ]
Bedair, S. M. [1 ]
机构
[1] North Carolina State Univ, Dept Elect & Comp Engn, Raleigh, NC 27695 USA
[2] North Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA
基金
美国国家科学基金会;
关键词
InGaN; multiple quantum wells; MOCVD;
D O I
10.1088/1361-6641/abe141
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The effect of underlying highly relaxed InyGa1-yN templates on InxGa1-xN multiple quantum wells (MQWs), where x> y, is investigated. Photoluminescence (PL) measurements and tested light emitting diodes (LEDs) show that relaxed InyGa1-yN templates with y similar to 10% can cause a red shift in MQWs emission of Delta E similar to 0.33eV<i. This red shift is attributed to the reduced strain in the MQWs, resulting in a decrease in the MQWs band gap, along with an increase in indium incorporation in the QWs due to composition pulling effect. Theoretical modeling was applied to study the effect of the template's indium content and its degree of relaxation on the observed red shift in MQW emission. The proposed model uses the PL emission data from the MQW to predict the indium content in the MQWs grown on GaN and on InGaN templates. Using this model, we are able to predict the dependence of both the amount of the red shift and the indium incorporation enhancement in the QWs on the In-content in the underlying templates. We are not aware of any similar modeling activities that reported such predictions. LED devices were fabricated using the InyGa1-yN templates and compared to conventional LED structure grown on GaN, showing a red shift in electroluminescence that agrees with the PL results.
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页数:9
相关论文
共 31 条
[1]   Growth and characterization of InxGa1-xN (0 < x < 0.16) templates for controlled emissions from MQW [J].
Abdelhamid, Mostafa ;
Reynolds, J. G. ;
El-Masry, N. A. ;
Bedair, S. M. .
JOURNAL OF CRYSTAL GROWTH, 2019, 520 :18-26
[2]   Emission wavelength red-shift by using "semi-bulk" InGaN buffer layer in InGaN/InGaN multiple-quantum-well [J].
Alam, Saiful ;
Sundaram, Suresh ;
Li, Xin ;
El Gmili, Youssef ;
Elouneg-Jamroz, Miryam ;
Robin, Ivan Christophe ;
Patriarche, Gilles ;
Salvestrini, Jean-Paul ;
Voss, Paul L. ;
Ougazzaden, Abdallah .
SUPERLATTICES AND MICROSTRUCTURES, 2017, 112 :279-286
[3]  
Bernardini F, 1999, PHYS STATUS SOLIDI B, V216, P391, DOI 10.1002/(SICI)1521-3951(199911)216:1<391::AID-PSSB391>3.0.CO
[4]  
2-K
[5]   Nonlinear macroscopic polarization in III-V nitride alloys [J].
Bernardini, F ;
Fiorentini, V .
PHYSICAL REVIEW B, 2001, 64 (08)
[6]  
Bernardini F., 2007, NITRIDE SEMICONDUCTO, P49
[7]   Characterization of III nitride materials and devices by secondary ion mass spectrometry [J].
Chu, PK ;
Gao, YM ;
Erickson, JW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (01) :197-203
[8]   Long wavelength emitting GaInN quantum wells on metamorphic GaInN buffer layers with enlarged in-plane lattice parameter [J].
Daeubler, J. ;
Passow, T. ;
Aidam, R. ;
Koehler, K. ;
Kirste, L. ;
Kunzer, M. ;
Wagner, J. .
APPLIED PHYSICS LETTERS, 2014, 105 (11)
[9]   Full InGaN red light emitting diodes [J].
Dussaigne, A. ;
Barbier, F. ;
Damilano, B. ;
Chenot, S. ;
Grenier, A. ;
Papon, A. M. ;
Samuel, B. ;
Ben Bakir, B. ;
Vaufrey, D. ;
Pillet, J. C. ;
Gasse, A. ;
Ledoux, O. ;
Rozhavskaya, M. ;
Sotta, D. .
JOURNAL OF APPLIED PHYSICS, 2020, 128 (13)
[10]   Observing relaxation in device quality InGaN templates by TEM techniques [J].
Eldred, Tim B. ;
Abdelhamid, Mostafa ;
Reynolds, J. G. ;
El-Masry, N. A. ;
LeBeau, James M. ;
Bedair, S. M. .
APPLIED PHYSICS LETTERS, 2020, 116 (10)