Development of high efficiency 255-355nm AlGaN-based light-emitting diodes

被引:107
作者
Pernot, Cyril [1 ]
Fukahori, Shinya [1 ]
Inazu, Tetsuhiko [1 ]
Fujita, Takehiko [1 ]
Kim, Myunghee [1 ]
Nagasawa, Yosuke [1 ]
Hirano, Akira [1 ]
Ippommatsu, Masamichi [1 ]
Iwaya, Motoaki [2 ]
Kamiyama, Satoshi [2 ,3 ]
Akasaki, Isamu [2 ]
Amano, Hiroshi [4 ]
机构
[1] Meijo Univ, UV Craftory Co Ltd, Tempaku Ku, Nagoya, Aichi 4680073, Japan
[2] Meijo Univ, Fac Sci & Technol, Tempaku Ku, Nagoya, Aichi 4688502, Japan
[3] Nagoya Univ, Akasaki Inst 3F, EL SEED Corp, Chikusa Ku, Nagoya, Aichi 4648601, Japan
[4] Nagoya Univ, Akasaki Res Ctr, Grad Sch Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2011年 / 208卷 / 07期
关键词
AlGaN; AlN; EQE; ligth extraction; UV LED; UV DEVICES;
D O I
10.1002/pssa.201001037
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report on the fabrication and characterization of high efficiency ultraviolet (UV) light emitting diodes (LEDs) with emission wavelength ranging from 255 to 355 nm. Epi-layers of UV LEDs were grown on AlGaN templates with sapphire substrates. Flip-chip configuration without removing sapphire is used for characterization of the UV LEDs. External quantum efficiencies (EQEs) over 3% were obtained for all the investigated wavelengths with maximum value reaching 5.1% for 280 nm LED. Under RT DC operation at a current of 500 mA, output powers of 38, 77, and 64 mW were measured for 257, 280, and 354 nm, respectively. By using enhanced light extraction technologies, such as, moth-eye structure on the back side of the sapphire substrate, we expect to improve these values by up to 50%. (C) 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:1594 / 1596
页数:3
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