X-ray diffraction Debye Ring Analysis for STress measurement (DRAST): a new method to evaluate residual stresses

被引：72
|
作者：
Gelfi, M
Bontempi, E
Roberti, R
Depero, LE
机构：
[1] Univ Brescia, INSTM, I-25123 Brescia, Italy
[2] Univ Brescia, Dipartimento Ingn Meccan, I-25123 Brescia, Italy
来源：
ACTA MATERIALIA | 2004年 / 52卷 / 03期
关键词：
X-ray microdiffraction; residual stress; coatings;
D O I：
10.1016/j.actamat.2003.09.041
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Residual stresses are one of the important feature determining the performance of structural as well as functional materials. Since residual stresses are difficult to be predicted they must be reliably measured. X-Ray microdiffraction laboratory systems equipped with 2D detectors allow to evaluate them with a very high spatial resolution. In this work a new method to evaluate residual stresses based on the analysis of a single Debye ring is proposed. This method is particularly suitable for the stress analysis of coatings and for sample with complex geometry. Examples are discussed and the results compared with those obtained by the conventional d-sin(2)psi method. (C) 2003 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码：583 / 589
页数：7
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