Epitaxial graphene FETs with high on/off ratio grown on 4H-SiC

被引:0
|
作者
Yoh, Kanji [1 ]
Konishi, Keita [1 ]
Hibino, Hiroki [2 ]
机构
[1] Hokkaido Univ, RCIQE, Sapporo, Hokkaido, Japan
[2] Basic Res Lab, Atsugi, Kanagawa, Japan
来源
2009 9TH IEEE CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO) | 2009年
关键词
graphene; SiC; GRAPHITE; GAS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
There have been technical issues for integrated graphene electronics applications such as low ON/OFF ratio due to its zero-gap band structure, lackof saturation characteristics and well-controlled fabrication method of graphene layers. Here wereport device characteristics of graphene FETs grown on 4H-SiC that show typical ambipolar effect against gate voltage and Ids-Vds curve with ON-OFF ratio of over 100 at 1.4K.
引用
收藏
页码:334 / 336
页数:3
相关论文
共 50 条
  • [21] A high performance 4H-SiC normally-off VJFET
    Zhao, JH
    Tone, K
    Sheng, K
    Li, X
    Alexandrov, P
    Fursin, L
    Weiner, M
    Burke, T
    IPEMC 2004: THE 4TH INTERNATIONAL POWER ELECTRONICS AND MOTION CONTROL CONFERENCE, VOLS 1-3, CONFERENCE PROCEEDINGS, 2004, : 342 - 346
  • [22] Switching Performance of Epitaxially Grown Normally-off 4H-SiC JFET
    Malhan, R. K.
    Rashid, S. J.
    Kataoka, M.
    Takeuchi, Y.
    Sugiyama, N.
    Udrea, F.
    Amaratunga, G. A. J.
    Reimann, T.
    SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2, 2009, 600-603 : 1067 - +
  • [23] Edge states of epitaxially grown graphene on 4H-SiC(0001) studied by scanning tunneling microscopy
    Ye, M.
    Cui, Y. T.
    Nishimura, Y.
    Yamada, Y.
    Qiao, S.
    Kimura, A.
    Nakatake, M.
    Namatame, H.
    Taniguchi, M.
    EUROPEAN PHYSICAL JOURNAL B, 2010, 75 (01): : 31 - 35
  • [24] High-Power 4H-SiC MOSFET with an Epitaxial Buried Channel
    A. I. Mikhaylov
    A. V. Afanasyev
    V. A. Ilyin
    V. V. Luchinin
    S. A. Reshanov
    A. Schöner
    Semiconductors, 2020, 54 : 122 - 126
  • [25] Investigation of Graphene Growth on 4H-SiC
    Castaing, A.
    Guy, O. J.
    Lodzinski, M.
    Wilks, S. P.
    SILICON CARBIDE AND RELATED MATERIALS 2008, 2009, 615-617 : 223 - 226
  • [26] Raman Studies of Graphene Films Grown on 4H-SiC Subjected to Deposition of Ni
    Eliseyev, I. A.
    Davydov, V. Yu
    Smirnov, A. N.
    Belov, S., V
    Zubov, A., V
    Lebedev, S. P.
    Lebedev, A. A.
    SEMICONDUCTORS, 2020, 54 (12) : 1674 - 1677
  • [27] Micro/Nanoscale Spatial Resolution Temperature Probing for the Interfacial Thermal Characterization of Epitaxial Graphene on 4H-SiC
    Yue, Yanan
    Zhang, Jingchao
    Wang, Xinwei
    SMALL, 2011, 7 (23) : 3324 - 3333
  • [28] Raman Studies of Graphene Films Grown on 4H-SiC Subjected to Deposition of Ni
    I. A. Eliseyev
    V. Yu. Davydov
    A. N. Smirnov
    S. V. Belov
    A. V. Zubov
    S. P. Lebedev
    A. A. Lebedev
    Semiconductors, 2020, 54 : 1674 - 1677
  • [29] Bilayer Graphene Grown on 4H-SiC (0001) Step-Free Mesas
    Nyakiti, L. O.
    Myers-Ward, R. L.
    Wheeler, V. D.
    Imhoff, E. A.
    Bezares, F. J.
    Chun, H.
    Caldwell, J. D.
    Friedman, A. L.
    Matis, B. R.
    Baldwin, J. W.
    Campbell, P. M.
    Culbertson, J. C.
    Eddy, C. R., Jr.
    Jernigan, G. G.
    Gaskill, D. K.
    NANO LETTERS, 2012, 12 (04) : 1749 - 1756
  • [30] Nitrogen doping of chemical vapor deposition grown graphene on 4H-SiC (0001)
    Urban, J. M.
    Dabrowski, P.
    Binder, J.
    Kopciuszynski, M.
    Wysmolek, A.
    Klusek, Z.
    Jalochowski, M.
    Strupinski, W.
    Baranowski, J. M.
    JOURNAL OF APPLIED PHYSICS, 2014, 115 (23)