Total-dose and single-event effects in switching DC/DC power converters

被引：38

作者：

Adell, PC ^{[1
]}

Schrimpf, RD ^{[1
]}

Choi, BK ^{[1
]}

Holman, WT ^{[1
]}

Attwood, JP ^{[1
]}

Cirba, CR ^{[1
]}

Galloway, KF ^{[1
]}

机构：

[1] Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2002年 / 49卷 / 06期

关键词：

boost converter; buck converter; DOM power converters; pulse width modulation; radiation; single event effects; single event transient; total dose;

D O I：

10.1109/TNS.2002.805425

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Total-dose and. single-event effects in discrete switching DOM power converters are examined using a combination of circuit measurements and simulations. The total-dose experiments focus on the response of the power MOSFET used as the switching element for the converters. The efficiencies of two different types of converters (boost and buck) degrade with increasing total dose, leading to eventual functional failure. The single-event transient response of the converters is determined by the response of the feedback control circuitry. Radiation response is studied using both electrical measurements and simulation techniques, and issues affecting circuit failure are identified. Index Terms-boost converter, buck converter, DOM power converters, pulse width modulation, radiation, single event effects, single event transient, total dose.

引用

页码：3217 / 3221

页数：5

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