Measurement of temperature dependence of relative permittivity by the cavity perturbation method

被引:0
作者
Takahashi, T
Iijima, Y
Miura, T
机构
来源
1997 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS I-III: HIGH FREQUENCIES IN HIGH PLACES | 1997年
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new cavity perturbation method has been proposed as a technique for evaluating the temperature dependence of relative permittivity, tau epsilon, in the pseudo-microwave range. In order to increase the accuracy of this method, an automatic measuring apparatus, satisfying the perturbation principle, was constructed and improvements in data processing were employed, such as the periodic least square method. Results for some microwave dielectrics demonstrated that measured re values for this method conform to those of the dielectric rod resonator method.
引用
收藏
页码:1683 / 1686
页数:4
相关论文
empty
未找到相关数据