Low coercive field of polymer ferroelectric via x-ray induced phase transition

被引：7

作者：

Lee, Hyeon Jun ^{[1
]}

Kim, Jihong ^{[1
]}

Kwon, Owoong ^{[2
]}

Lee, Hye Jeong ^{[1
]}

Kwak, Jeong Hun ^{[1
]}

Kim, Jae Myung ^{[1
]}

Lee, Sung Su ^{[1
]}

Kim, Yunseok ^{[2
]}

Kim, Dong-Yu ^{[1
]}

Jo, Ji Young ^{[1
]}

机构：

[1] Gwangju Inst Sci & Technol, Sch Mat Sci & Engn, Oryong Dong 61005, Gwangju, South Korea

[2] Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 400746, Gyeonggi Do, South Korea

来源：

APPLIED PHYSICS LETTERS | 2015年 / 107卷 / 26期

基金：

新加坡国家研究基金会;

关键词：

POLY(VINYLIDENE FLUORIDE-TRIFLUOROETHYLENE) COPOLYMER; EFFECT TRANSISTORS; BEHAVIOR; MEMORY;

D O I：

10.1063/1.4938757

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present an experimental strategy via X-ray irradiation combined with time-resolved X-ray diffraction to reduce a coercive field of ferroelectric thin films. We found in real-time that X-ray irradiation enables the irreversible phase transition from a polar to non-polar phase in ferroelectric poly(vinylidene fluoride-trifluoroethylene) thin films. The non-polar regions act as initial nucleation sites for opposite domains thus reducing the coercive field, directly related to the switching of domains, by 48%. (C) 2015 AIP Publishing LLC.

引用

页数：4

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