Calibration of the Fabry-Perot free spectral range using a tunable laser in a Michelson interferometer

被引:9
作者
Cabral, Alexandre Pereira [1 ]
Rebordao, Jose Manuel [1 ]
机构
[1] INETI, P-1649038 Lisbon, Portugal
关键词
Fabry-Perot; metrological instrumentation; interferometry; tunable lasers;
D O I
10.1117/1.2359427
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Coherent interferometric absolute distance metrology enables different techniques for length metrology. Measurements are made without ambiguity, by using either one or several synthetic wavelengths resulting from the beating of two or more wavelengths or, in the case of frequency sweeping interferometry (FSI), from a frequency sweep. These techniques require accurate measurements of the frequency variation, a task which is usually performed with a Fabry-Perot (FP) interferometer. Sensor performances are highly dependent on the FP free spectral range (FSR), which must be accurately known. We describe a method to measure the FSR of an FP using a tunable laser in a Michelson interferometer, using both absolute and relative distance measurements. The optical setup is based on a frequency-sweeping sensor and a controlled translation table. An uncertainty of 45 ppm in the measurement of a 1-GHz FSR is obtained. The method is indicated for the calibration of the FP in the frequency-sweep-range-measuring subsystem of a frequency sweeping sensor absolute distance sensor as it does not require any addition hardware, configuring a self-calibration approach. (c) 2006 Society of Photo-Optical Instrumentation Engineers.
引用
收藏
页数:3
相关论文
共 7 条
[1]  
Cabral A., 2005, P SOC PHOTO-OPT INS, V5879, P195
[2]  
Calvel B, 2004, ESA SP PUBL, V554, P501
[3]  
IOS, 1995, GUID EXPR UNC MEAS I
[4]   DISTANCE MEASUREMENT BY THE WAVELENGTH SHIFT OF LASER DIODE LIGHT [J].
KIKUTA, H ;
IWATA, K ;
NAGATA, R .
APPLIED OPTICS, 1986, 25 (17) :2976-2980
[5]   High precision free spectral range measurement using a phase modulated laser beam [J].
Manson, PJ .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (10) :3834-3839
[6]   Absolute distance metrology for space interferometers [J].
Swinkels, BL ;
Bhattacharya, N ;
Wielders, AA ;
Braat, JJM .
Optical Measurement Systems for Industrial Inspection IV, Pts 1 and 2, 2005, 5856 :312-317
[7]  
XIAOLI D, 1998, MEAS SCI TECHNOL, V9, P1031