Design of a t-chart using generalized multiple dependent state sampling

In this article, a new t-chart based on generalized multiple dependent state (GMDS) sampling is proposed for efficient monitoring of a process by assuming that the time between events follows the exponential distribution. The proposed t-chart has two pair of control limits and utilizes the past sample information with the current sample information. The control chart coefficients are estimated by considering different values of the in-control average run lengths. The proposed t-chart is compared with the existing chart by using the out-of-control average run length and extra quadratic loss function. The comparison reveals that the proposed charting strategy has better shift detection ability in process mean. An illustrative example is given for the practical implementation of the proposed chart.