Non-Destructive Evaluation of Deep-Lying Defects in Multilayer Conductors Using HTS SQUID Gradiometer

被引：12

作者：

Kawano, J. ^{[1
]}

Hato, T. ^{[1
]}

Adachi, S. ^{[1
]}

Oshikubo, Y. ^{[1
]}

Tsukamoto, A. ^{[1
]}

Tanabe, K. ^{[1
]}

机构：

[1] ISTEC, Superconduct Res Lab, Tokyo 1350062, Japan

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2011年 / 21卷 / 03期

关键词：

ECT; gradiometer; high temperature superconductor; multilayer conductor; NDE; NDT; ramp-edge junction; SQUID; COATED CONDUCTORS; NDE SYSTEM; MAGNETOMETERS;

D O I：

10.1109/TASC.2010.2090852

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We examined the ability to detect deep-lying defects in multilayer stacks of aluminum plates using an eddy-current testing technique with HTS planar-type SQUID gradiometers. In addition to a previous gradiometer with a baseline of 1 mm, a new gradiometer with a baseline of 8.5 mm and a larger effective area fabricated by HTS multilayer and ramp-edge junction technologies was used. The frequency and depth dependences of the SQUID signal were compared between the two gradiometers. By employing the longer-baseline gradiometer and an excitation frequency of 35 Hz, a slit-like defect located at about 38 mm in depth could be clearly observed with a signal-to-noise ratio larger than 10.

引用

页码：428 / 431

页数：4

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