Method to diagnose open-circuit faults in active power switches and clamp-diodes of three-level neutral-point clamped inverters

被引：58

作者：

Abadi, Mohsen Bandar ^{[1
]}

Santos Mendes, Andre Manuel ^{[1
]}

Angelo Cruz, Sergio Manuel ^{[1
]}

机构：

[1] Univ Coimbra, Dept Elect & Comp Engn, Inst Telecomunicacoes, Polo 2 Pinhal Marrocos, P-3030290 Coimbra, Portugal

来源：

IET ELECTRIC POWER APPLICATIONS | 2016年 / 10卷 / 07期

关键词：

invertors; fault diagnosis; insulated gate bipolar transistors; semiconductor diodes; clamps; insulated gate bipolar transistor; clamp-diode; three-level neutral-point clamped inverter; multiple semiconductor open-circuit fault diagnosis; OC; output pole voltage evaluation; output current evaluation; modulation; MULTILEVEL CONVERTERS; MOTOR-DRIVES; INDUSTRIAL APPLICATIONS; VOLTAGE; ALGORITHM; SYSTEMS; VECTOR; ENERGY;

D O I：

10.1049/iet-epa.2015.0644

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new real-time method able to diagnose multiple semiconductor open-circuit (OC) faults in a three-level neutral-point clamped inverter is introduced in this paper. The proposed diagnostic method is based on the evaluation of the output pole voltages and output currents of the inverter. The proposed method allows a real-time detection and localisation of multiple OC faults in all active power switches and clamp-diodes within one modulation period. Experimental results obtained for different operating conditions of the inverter demonstrate the applicability and performance of the proposed diagnostic approach.

引用

收藏

页码：623 / 632

页数：10

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