Hopf bifurcation in the Hodgkin-Huxley model exposed to ELF electrical field

被引：38

作者：

Jiang, W ^{[1
]}

Tsang, KM

Hua, Z

机构：

[1] Tianjin Univ, Sch Elect Engn, Tianjin 300072, Peoples R China

[2] Hong Kong Polytech Univ, Dept Elect Engn, Kowloon, Hong Kong, Peoples R China

来源：

CHAOS SOLITONS & FRACTALS | 2004年 / 20卷 / 04期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1016/j.chaos.2003.08.011

中图分类号：

O1 [数学];

学科分类号：

0701 ; 070101 ;

摘要：

This paper discussed the interference between external electric exposure and biological objects. Based on results of space-time characteristics of trans-membrane voltage, the variation of cell trans-membrane voltage exposed to extremely low frequency (ELF) electrical field was analyzed; the traditional Hodgkin-Huxley model was modified by importing new parameter denoting external electrical fields, and the bifurcation caused by new parameter war found. This paper employed the algebra criterion in high dimension equations to perform the analysis of single parameter dynamical bifurcation. The results were biological significant and suggested that the aberration of dynamics in biosystems may be accounted for diseases caused by electric exposure. (C) 2003 Elsevier Ltd. All rights reserved.

引用

页码：759 / 764

页数：6

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