Mesh Refinement in Eddy Current Testing With Separated T-R Probes

被引：9

作者：

Choua, Yahya ^{[1
]}

Santandrea, Laurent ^{[1
]}

Le Bihan, Yann ^{[1
]}

Marchand, Claude ^{[1
]}

机构：

[1] UPMC Univ Paris Sud Plateau Moulon, CNRS SUPELEC, Lab Genie Elect Paris, F-91192 Gif Sur Yvette, France

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2010年 / 46卷 / 08期

关键词：

Adaptive mesh refinement; Eddy current testing; finite element method; separated T-R probes; thin cracks; COMPLEMENTARY FORMULATIONS;

D O I：

10.1109/TMAG.2010.2045488

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper we are interested in FEM mesh refinement procedure in ECT problems with separated T-R (Transmitter and Receiver probes) probes. Local error estimators used for a posteriori h-type mesh refinement are presented. They are based on the complementarity of the E and H formulations. A new estimator is proposed combining the solutions obtained by feeding alternatively the transmitter and the receiver. This estimator proves to be very accurate compared to classical ones.

引用

页码：2795 / 2798

页数：4

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