Structural phase transition of aluminum induced by electronic excitation

被引：100

作者：

Guo, C ^{[1
]}

Rodriguez, G ^{[1
]}

Lobad, A ^{[1
]}

Taylor, AJ ^{[1
]}

机构：

[1] Univ Calif Los Alamos Natl Lab, Condensed Matter & Thermal Phys Grp, Los Alamos, NM 87545 USA

来源：

PHYSICAL REVIEW LETTERS | 2000年 / 84卷 / 19期

关键词：

D O I：

10.1103/PhysRevLett.84.4493

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The dynamics of a structural phase transition induced by interband electronic excitation in aluminum is studied by determining the time evolution of the dielectric constant at 1.55 eV through the measurement of the transient reflectivity induced by an ultrafast pump pulse. The threshold fluence and the time scale for this transition are significantly less than the values necessary for ultrafast heat-induced melting, indicating that this phase change is caused by band structure collapse and lattice instability resulting from strong electronic excitation.

引用

页码：4493 / 4496

页数：4

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