Xe and Ar nanobubbles in Al studied by photoemission spectroscopy

被引:26
作者
Dhaka, R. S. [1 ]
Biswas, C. [1 ]
Shukla, A. K. [1 ]
Barman, S. R. [1 ]
Chakrabarti, Aparna [2 ]
机构
[1] UGC DAE Consortium Sci Res, Indore 452001, Madhya Pradesh, India
[2] Raja Ramanna Ctr Adv Technol, Indore 452013, Madhya Pradesh, India
关键词
D O I
10.1103/PhysRevB.77.104119
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have studied xenon and argon bubbles formed in the subsurface region of Al(111) by x-ray photoelectron spectroscopy. As a consequence of the nanometer size of the bubbles, the photohole formed by Xe 3d or Ar 2p photoemission is screened by the Al conduction electrons, which substantially lowers the binding energy (BE) as compared to the gas phase. As the bubble size increases, the Al conduction electron screening decreases and the BE increases. On the basis of density functional theory, we show that the change in the bubble pressure with size is not responsible for the BE shift of inner shell core levels, such as Xe 3d or Ar 2p. On the other hand, an increase in BE with bubble size for outer shell core levels, such as Ar 3p, could be due to a decrease in both pressure and Al conduction electron screening. The core level line shape also changes with bubble size. For example, the spectra are broadened due to the distribution of the bubble radius around its mean value, and an asymmetry for small bubbles is observed that decreases for larger bubbles. An annealing of Xe and Ar bubbles after an implantation up to 640 K shows that the BE increases with annealing temperature. Since it is well known that bubble size increases with annealing temperature, this further supports our contention of BE shift with bubble size. A defect induced partial disorder of the Al(111) surface by Xe and Ar bombardment is observed by low energy electron diffraction, but this does not affect the Al 2p BE and line shape.
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页数:12
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