Planar waveguides in Yb3+-doped tellurite glasses fabricated by ion implantation of oxygen

被引：8

作者：

Liu, Chun-Xiao ^{[1
]}

Xut, Jun ^{[2
]}

Zhou, Zhi-Guang ^{[3
]}

Fu, Li-Li ^{[4
]}

Zheng, Rui-Lin ^{[1
]}

Li, Wei-Nan ^{[4
]}

Guo, Hai-Tao ^{[3
]}

Lin, She-Bao ^{[5
]}

Wei, Wei ^{[1
]}

机构：

[1] Nanjing Univ Posts & Telecommun, Sch Optoelect Engn, Nanjing 210230, Jiangsu, Peoples R China

[2] East China Jiaotong Univ, Sch Informat Engn, Nanchang 330013, Peoples R China

[3] Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China

[4] Nanjing Univ Posts & Telecommun, Coll Elect Sci & Engn, Nanjing 210230, Jiangsu, Peoples R China

[5] Baoji Univ Arts & Sci, Dept Phys & Informat Technol, Baoji 721007, Peoples R China

来源：

MODERN PHYSICS LETTERS B | 2015年 / 29卷 / 08期

基金：

中国国家自然科学基金;

关键词：

Waveguide; ion implantation; Yb3+-doped tellurite glass; REFRACTIVE-INDEX PROFILES; EMISSION CROSS-SECTION; LASER;

D O I：

10.1142/S0217984915500219

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A planar waveguide is demonstrated in the Yb3+-doped tellurite glass, using (5+6) MeV O3+ ion implantation with doses of (4 + 8) x 10(14) ions/cm(2). The implantation process of O3+ ions into the Yb3+-doped tellurite glass is simulated by the stopping and range of ions in matter (SRIM) 2010 code. The dark-mode spectra are measured by the prism-coupling system at lambda = 632.8 nm. The reflectivity calculation method and the finite-difference beam propagation method are used to calculate the refractive index profile and the modal profile of transverse electric (TE) mode of the fabricated waveguide, respectively. The absorption spectra show that the transmission properties are not affected by the waveguide fabrication process.

引用

页数：8

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