Robustness of Display Reflectance Measurements: Comparison between BRDF and Hemispherical Diffuse Reflectance

被引：0

作者：

Kim, Seungkwan ^{[1
]}

Kelley, Edward F. ^{[2
]}

Penczek, John ^{[2
]}

机构：

[1] KRISS, Div Phys Metrol, Taejon, South Korea

[2] NIST, Optoelect Div, Boulder, CO USA

来源：

2009 SID INTERNATIONAL SYMPOSIUM DIGEST OF TECHNICAL PAPERS, VOL XL, BOOKS I - III | 2009年

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D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We measured in plane bidirectional-reflectance-distribution-function (BRDF) profiles for specular, haze and Lambertian samples rising a converging light beam and a photopic photodiode. The results were validated by comparing the hemispherical reflectance values calculated from BRDF data with direct measurements by the use of integrating spheres, whereby an agreement to within 2% was achieved.

引用

页码：325 / +

页数：2