Modification of various properties of HfO2 thin films obtained by changing magnetron sputtering conditions

被引:23
作者
Mazur, Michal [1 ]
Howind, Torsten [2 ]
Gibson, Des [2 ]
Kaczmarek, Danuta [1 ]
Morgiel, Jerzy [3 ]
Wojcieszak, Damian [1 ]
Zhu, Wenzhong [2 ]
Mazur, Piotr [4 ]
机构
[1] Wroclaw Univ Technol, Fac Microsyst Elect & Photon, Janiszewskiego 11-17, PL-50372 Wroclaw, Poland
[2] Univ West Scotland, Scottish Univ Phys Alliance, Inst Thin Films Sensors & Imaging, High St, Paisley PA1 2BE, Renfrew, Scotland
[3] Polish Acad Sci, Inst Met & Mat Sci, Reymonta 25, PL-30059 Cracov, Poland
[4] Univ Wroclaw, Inst Expt Phys, Max Born 9, PL-50204 Wroclaw, Poland
关键词
HfO2; Thin films; Magnetron sputtering; Microstructure; Optical properties; Mechanical properties; OPTICAL-PROPERTIES; MICROSTRUCTURE;
D O I
10.1016/j.surfcoat.2016.12.001
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this work, properties of hafnium dioxide (HfO2) thin films deposited by magnetron sputtering with different powers (i.e. 200 W, 400 W and 600 W) were described. Based on microstructure measurements obtained by X-ray diffraction, Raman scattering and transmission electron microscopy method it was observed that there is a significant influence of the sputtering power on investigated properties of HfO2 thin films. Increase of the sputtering power caused, e.g. an increase of average crystallite size and surface roughness. Microstructure of thin films deposited with lower power was composed from a large number of voids that resulted in significant changes of their optical and mechanical properties. Results of optical studies showed that all deposited thin films were well transparent in a visible light range. Refractive index increased gradually with an increase of deposition power from 1.86 (200 W) to 2.09 (600 W). Performed investigations of mechanical properties revealed that hardness and Young's elastic modulus of HfO2 thin films increased with an increase of the sputtering power. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:426 / 431
页数:6
相关论文
共 20 条
[1]   Optical properties of hafnium oxide thin films and their application in energy-efficient windows [J].
Al-Kuhaili, MF .
OPTICAL MATERIALS, 2004, 27 (03) :383-387
[2]   Phase transition in sputtered HfO2 thin films: A qualitative Raman study [J].
Belo, G. S. ;
Nakagomi, F. ;
Minko, A. ;
da Silva, S. W. ;
Morais, P. C. ;
Buchanan, D. A. .
APPLIED SURFACE SCIENCE, 2012, 261 :727-729
[3]  
Crist B.V., 1999, Handbook of Monochromatic XPS spectra, Mountain View
[4]   Effects of substrate temperature on the structural, optical and resistive switching properties of HfO2 films [J].
Du, Qianqian ;
Wang, Wenjun ;
Li, Shuhong ;
Zhang, Dong ;
Zheng, Wanquan .
THIN SOLID FILMS, 2016, 608 :21-25
[5]   A study on structural, optical and hydrophobic properties of oblique angle sputter deposited HfO2 films [J].
Jain, Ravish K. ;
Gautam, Yogendra K. ;
Dave, Vikramaditya ;
Chawla, Amit K. ;
Chandra, Ramesh .
APPLIED SURFACE SCIENCE, 2013, 283 :332-338
[6]   Effect of O2/Ar gas flow ratio on the optical properties and mechanical stress of sputtered HfO2 thin films [J].
Jena, S. ;
Tokas, R. B. ;
Misal, J. S. ;
Rao, K. D. ;
Udupa, D. V. ;
Thakur, S. ;
Sahoo, N. K. .
THIN SOLID FILMS, 2015, 592 :135-142
[7]  
Kaczmarek D., 2011, Polish patent application P, Patent No. 396389
[8]   Microstructure and optical dispersion characterization of nanocomposite sol-gel TiO2-SiO2 thin films with different compositions [J].
Kermadi, S. ;
Agoudjil, N. ;
Sali, S. ;
Zougar, L. ;
Boumaour, M. ;
Broch, L. ;
Naciri, A. En ;
Placido, F. .
SPECTROCHIMICA ACTA PART A-MOLECULAR AND BIOMOLECULAR SPECTROSCOPY, 2015, 145 :145-154
[9]  
Klug H.P., 1974, XRAY DIFFRACTION PRO, V2nd, P992
[10]   Effects of substrate temperature on properties of HfO2, HfO2:Al and HfO2:W films [J].
Lin, Su-Shia ;
Liao, Chung-Sheng ;
Fan, Sheng-You .
SURFACE & COATINGS TECHNOLOGY, 2015, 271 :269-275