Treatment of surfaces with low-energy electrons

被引:9
作者
Frank, L. [1 ]
Mikmekova, E. [1 ,2 ]
Lejeune, M. [3 ]
机构
[1] CAS, Inst Sci Instruments, Vvi, Kralovopolska 147, Brno 61264, Czech Republic
[2] FEI Co, Achtseweg Noord 5, NL-5651 GG Eindhoven, Netherlands
[3] Univ Picardie Jules Verne, Fac Sci Amiens, LPMC, 33 Rue St Leu, F-80039 Amiens 2, France
关键词
Low-energy electrons; Electron beam induced release; Graphene; Ultimate cleaning of surfaces; INDUCED CARBON DEPOSITION; THIN-FILMS; BEAM; CONTAMINATION; MICROSCOPY; FABRICATION;
D O I
10.1016/j.apsusc.2017.02.131
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Electron-beam-induced deposition of various materials from suitable precursors has represented an established branch of nanotechnology for more than a decade. A specific alternative is carbon deposition on the basis of hydrocarbons as precursors that has been applied to grow various nanostructures including masks for subsequent technological steps. Our area of study was unintentional electron-beam-induced carbon deposition from spontaneously adsorbed hydrocarbon molecules. This process traditionally constitutes a challenge for scanning electron microscopy practice preventing one from performing any true surface studies outside an ultrahigh vacuum and without in-situ cleaning of samples, and also jeopardising other electron-optical devices such as electron beam lithographs. Here we show that when reducing the energy of irradiating electrons sufficiently, the e-beam-induced deposition can be converted to e-beam-induced release causing desorption of hydrocarbons and ultimate cleaning of surfaces in both an ultrahigh and a standard high vacuum. Using series of experiments with graphene samples, we demonstrate fundamental features of e-beam-induced desorption and present results of checks for possible radiation damage using Raman spectroscopy that led to optimisation of the electron energy for damage-free cleaning. The method of preventing carbon contamination described here paves the way for greatly enhanced surface sensitivity of imaging and substantially reduced demands on vacuum systems for nanotechnological applications. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码:105 / 108
页数:4
相关论文
共 25 条
[1]   Review of magnetic nanostructures grown by focused electron beam induced deposition (FEBID) [J].
De Teresa, J. M. ;
Fernandez-Pacheco, A. ;
Cordoba, R. ;
Serrano-Ramon, L. ;
Sangiao, S. ;
Ibarra, M. R. .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2016, 49 (24)
[2]   Electron-beam induced carbon deposition used as a mask for cadmium sulfide deposition on Si(100) [J].
Djenizian, T ;
Petite, B ;
Santinacci, L ;
Schmuki, P .
ELECTROCHIMICA ACTA, 2001, 47 (06) :891-897
[3]   Electron beam-induced carbon masking for electrodeposition on semiconductor surfaces [J].
Djenizian, T ;
Santinacci, L ;
Schmuki, P .
APPLIED PHYSICS LETTERS, 2001, 78 (19) :2940-2942
[4]   THE ORIGIN OF SPECIMEN CONTAMINATION IN THE ELECTRON MICROSCOPE [J].
ENNOS, AE .
BRITISH JOURNAL OF APPLIED PHYSICS, 1953, 4 (APR) :101-106
[5]   Direct-write deposition with a focused electron beam [J].
Fischer, M. ;
Wanzenboeck, H. D. ;
Gottsbachner, J. ;
Mueller, S. ;
Brezna, W. ;
Schramboeck, M. ;
Bertagnolli, E. .
MICROELECTRONIC ENGINEERING, 2006, 83 (4-9) :784-787
[6]   Counting graphene layers with very slow electrons [J].
Frank, Ludek ;
Mikmekova, Eliska ;
Muellerova, Ilona ;
Lejeune, Michael .
APPLIED PHYSICS LETTERS, 2015, 106 (01)
[7]   Synthesis and thermal stability of Pt3Si, Pt2Si, and PtSi films grown by e-beam co-evaporation [J].
Fryer, Robert T. ;
Lad, Robert J. .
JOURNAL OF ALLOYS AND COMPOUNDS, 2016, 682 :216-224
[8]   Microscopic thickness determination of thin graphite films formed on SiC from quantized oscillation in reflectivity of low-energy electrons [J].
Hibino, H. ;
Kageshima, H. ;
Maeda, F. ;
Nagase, M. ;
Kobayashi, Y. ;
Yamaguchi, H. .
PHYSICAL REVIEW B, 2008, 77 (07)
[9]  
HIRSCH P, 1994, SCANNING, V16, P101
[10]   Electron beam influence on the carbon contamination of electron irradiated hydroxyapatite thin films [J].
Hristu, Radu ;
Stanciu, Stefan G. ;
Tranca, Denis E. ;
Stanciu, George A. .
APPLIED SURFACE SCIENCE, 2015, 346 :342-347