Separation of Lift-off and Defect Depth Features in Magnetic Sensor based Pulsed Eddy Current Signals

被引：1

作者：

Adewale, Ibukun D. ^{[1
]}

Tian, Gui Y. ^{[1
,2
]}

Dong, Song H. ^{[3
]}

Ting, Guo X. ^{[3
]}

Zeng Yanli ^{[3
]}

Liu Guangheng ^{[3
]}

机构：

[1] Newcastle Univ, Sch Elect & Elect Engn, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England

[2] Univ Elect Sci & Technol China, Sch Automat Engn, Hefei, Anhui, Peoples R China

[3] Shenyang Acad Instrumentat Sci Co, Shenyang, Liaoning, Peoples R China

来源：

ELECTROMAGNETIC NONDESTRUCTIVE EVALUATION (XVIII) | 2015年 / 40卷

关键词：

Pulsed Eddy Current; Lift-off point of Intersection; lift-off; defect characterisation; THICKNESS MEASUREMENT; INVARIANCE; TRANSIENT;

D O I：

10.3233/978-1-61499-509-8-211

中图分类号：

O3 [力学];

学科分类号：

08 ; 0801 ;

摘要：

This paper focuses on defect characterisation independent of the lift-off effects using lift-off point of intersection (LOI) and the separation of these two parameters in pulsed eddy current (PEC) measurements for ferrous and nonferrous materials. It reveals, amongst other things, that the first order derivative of the normalised PEC response maintains the LOI feature, which otherwise is not apparent in ferromagnetic materials using current methods; lift-off effects in ferrous materials vary strongly with the second order derivative of the normalised PEC response and the LOI can be used for defect estimation in a magnetic sensor-based PEC. These two characteristics provide a means of separating lift-off effects from the defect.

引用

页码：211 / 221

页数：11

共 19 条

[1] Decoupling the Influence of Permeability and Conductivity in Pulsed Eddy-Current Measurements [J].

Adewale, Ibukun Dapo ;

Tian, Gui Yun .

IEEE TRANSACTIONS ON MAGNETICS, 2013, 49 (03) :1119-1127

[2]

Giguère S, 2000, AIP CONF PROC, V509, P449, DOI 10.1063/1.1306083

[3] Reduction of Lift-Off Effects in Pulsed Eddy Current for Defect Classification [J].

He, Yunze ;

Pan, Mengchun ;

Luo, Feilu ;

Tian, Guiyun .

IEEE TRANSACTIONS ON MAGNETICS, 2011, 47 (12) :4753-4760

[4]

Hoshikawa H, 2005, AIP CONF PROC, V760, P502, DOI 10.1063/1.1916717

[5]

Kim D, 2002, AIP CONF PROC, V615, P615, DOI 10.1063/1.1472855

[6]

Lathi B.P., 2002, LINEAR SYSTEMS SIGNA

[7]

Lefebvre JHV, 2008, INT J APPL ELECTROM, V27, P1

[8]

Lefebvre JHV, 2006, AIP CONF PROC, V820, P669

[9]

Lefebvre JHV, 2005, AIP CONF PROC, V760, P523, DOI 10.1063/1.1916720

[10] Fast analytical modelling for pulsed eddy current evaluation [J].

Li, Yong ;

Tian, Gul Yun ;

Simm, Anthony .

NDT & E INTERNATIONAL, 2008, 41 (06) :477-483

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