A 480 mW 2.6 GS/s 10b Time-Interleaved ADC With 48.5 dB SNDR up to Nyquist in 65 nm CMOS

被引:80
作者
Doris, Kostas [1 ]
Janssen, Erwin [1 ]
Nani, Claudio [1 ]
Zanikopoulos, Athon [1 ]
van der Weide, Gerard [1 ]
机构
[1] NXP Semicond, NL-5656 AE Eindhoven, Netherlands
关键词
Analog-to-digital converter; calibration; clock jitter; direct sampling receiver; Nyquist converter; successive approximation register; time-interleaving; timing skew; track-and-hold; 10-BIT;
D O I
10.1109/JSSC.2011.2164961
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a 64-times interleaved 2.6 GS/s 10b successive-approximation-register (SAR) ADC in 65 nm CMOS. The ADC combines interleaving hierarchy with an open-loop buffer array operated in feedforward-sampling and feedback-SAR mode. The sampling front-end consists of four interleaved T/Hs at 650 MS/s that are optimized for timing accuracy and sampling linearity, while the back-end consists of four ADC arrays, each consisting of 16 10b current-mode non-binary SAR ADCs. The interleaving hierarchy allows for many ADCs to be used per T/H and eliminates distortion stemming from open loop buffers interfacing between the front-end and back-end. Startup on-chip calibration deals with offset and gain mismatches as well as DAC linearity. Measurements show that the prototype ADC achieves an SNDR of 48.5 dB and a THD of less than -58 dB at Nyquist with an input signal of 1.4 Vpp-diff. An estimated sampling clock skew spread of 400 fs is achieved by careful design and layout. Up to 4 GHz an SNR of more than 49 dB has been measured, enabled by the less than 110 fs rms clock jitter. The ADC consumes 480 mW from 1.2/1.3/1.6 V supplies and occupies an area of 5.1 mm(2).
引用
收藏
页码:2821 / 2833
页数:13
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