Accounting for the JKR-DMT transition in adhesion and friction measurements with atomic force microscopy

被引:178
作者
Grierson, DS [1 ]
Flater, EE [1 ]
Carpick, RW [1 ]
机构
[1] Univ Wisconsin, Dept Engn Phys, Madison, WI 53706 USA
基金
美国国家科学基金会;
关键词
atomic force microscopy (AFM); adhesion; friction; nanotribology; contact mechanics;
D O I
10.1163/1568561054352685
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
Over the last 15 years, researchers have applied theories of continuum contact mechanics to nanotribology measurements to determine fundamental parameters and processes at play in nanometer-scale contacts. In this paper we discuss work using the atomic force microscope to determine nanoscale adhesion and friction properties between solids. Our focus is on the role that continuum contact mechanics plays in analyzing these measurements. In particular, we show how the JKR-to-DMT transition is taken into account, as well as limitations involved in using these models of contact in the presence of adhesion.
引用
收藏
页码:291 / 311
页数:21
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