Micromagnetic simulation of the pinning and depinning process in permanent magnets

被引：15

作者：

Scholz, W ^{[1
]}

Schrefl, T ^{[1
]}

Fidler, J ^{[1
]}

Matthias, T ^{[1
]}

Suess, D ^{[1
]}

Tsiantos, V ^{[1
]}

机构：

[1] Vienna Tech Univ, Inst Solid State Phys, A-1040 Vienna, Austria

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2003年 / 39卷 / 05期

基金：

奥地利科学基金会;

关键词：

domain wall pinning; finite-element method; micromagnetics; SmCo;

D O I：

10.1109/TMAG.2003.815747

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have studied the pinning of magnetic domain walls on a simplified model of the cell structure of Sm(Co,Fe,Cu,Zr)(z) precipitation hardened magnets. The pinning field strongly depends on the thickness of the intercellular phase if it is smaller than the domain wall width. Its maximum value has been verified with a one-dimensional analytical model. The cell structure plays an important role in the depinning process and it has been found that the pinning field depends linearly on the relative thickness of the intercellular phase. This behavior is universal for attractive and repulsive pinning.

引用

页码：2920 / 2922

页数：3

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