Single Event Upset Analysis: On-orbit performance of the Alpha Magnetic Spectrometer Digital Signal Processor Memory aboard the International Space Station

被引：6
作者：
Li, Jiaqiang [1 ]
Choutko, Vitaly [2 ]
Xiao, Liyi [1 ]
机构：
[1] Harbin Inst Technol, Microelect Ctr, Harbin 150001, Heilongjiang, Peoples R China
[2] MIT, 77 Massachusetts Ave, Cambridge, MA 02139 USA
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2018年 / 885卷
关键词：
AMS; On-Orbit; SEU; SAA; Solar event; Memory;
D O I：
10.1016/j.nima.2017.12.035
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Based on the collection of error data from the Alpha Magnetic Spectrometer (AMS) Digital Signal Processors (DSP), on-orbit Single Event Upsets (SEUs) of the DSP program memory are analyzed. The daily error distribution and time intervals between errors are calculated to evaluate the reliability of the system. The particle density distribution of International Space Station (ISS) orbit is presented and the effects from the South Atlantic Anomaly (SAA) and the geomagnetic poles are analyzed. The impact of solar events on the DSP program memory is carried out combining data analysis and Monte Carlo simulation (MC). From the analysis and simulation results, it is concluded that the area corresponding to the SAA is the main source of errors on the ISS orbit. Solar events can also cause errors on DSP program memory, but the effect depends on the on-orbit particle density. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码：98 / 104
页数：7
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