Preparation and quality assessment of CuS thin films encapsulated in glass

被引：24

作者：

Bollero, A. ^{[1
]}

Fernandez, S. ^{[1
]}

Rozman, K. Zuzek ^{[2
]}

Samardzija, Z. ^{[2
]}

Grossberg, M. ^{[3
]}

机构：

[1] CIEMAT, Dept Energy, E-28040 Madrid, Spain

[2] Jozef Stefan Inst, Dep Nanostruct Mat, SI-1000 Ljubljana, Slovenia

[3] Tallinn Univ Technol TUT, Dept Mat Sci, EE-19086 Tallinn, Estonia

来源：

THIN SOLID FILMS | 2012年 / 520卷 / 12期

关键词：

CuS; Solar control coating; Thin film; Physical vapor deposition; GROWTH; SULFIDE; DEPOSITION;

D O I：

10.1016/j.tsf.2011.04.140

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Copper sulfide (CuS)-based thin films with different thickness have been prepared by thermal co-evaporation of the elemental constituents. Morphological and microstructural properties were shown to vary with film thickness. Optical properties of films encapsulated in a double-glazed configuration and containing an air gap have been measured. Encapsulated CuS films of thickness 100 and 150 nm showed high transmittance peak values of 48% and 36%, respectively, and a low reflectance below 20% and 15%, respectively, in the visible region. A low transmittance of similar to 10% (similar to 15%) and a high reflectance of similar to 45% (similar to 40%) in the near-infrared region were obtained for the film with 150 nm (100 nm). Thermal stability of the films has been proved by annealing of the films in air and Argon at 150 degrees C. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：4184 / 4189

页数：6

共 16 条

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