Novel parallel vacuum ultra-violet/X-ray fluorescence spectrometer

被引：18

作者：

Erko, A. ^{[1
]}

Firsov, A. ^{[1
]}

Senf, F. ^{[1
]}

机构：

[1] Helmholtz Zentrum Berlin Mat & Energie GmbH, Inst Nanometre Opt & Technol, Berlin, Germany

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2012年 / 67卷

关键词：

Femtosecond spectroscopy; Reflection zone plates; Parallel diffraction spectrometer;

D O I：

10.1016/j.sab.2012.01.001

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Novel instrumentation developments in X-ray spectroscopy for parallel spectral measurements with soft X-rays are described. The significant performance improvements are achieved utilising Fresnel diffraction from structures built onto the surface of a total external reflection mirror. An array of reflection zone plates was tested as a wavelength-dispersive fluorescence spectrometer for soft X-rays in the energy range of 100-550 eV. (C) 2012 Elsevier B.V. All rights reserved.

引用

页码：57 / 63

页数：7

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