SrTiO3(110) thin films grown directly on different oriented silicon substrates

We have grown (110)-oriented SrTiO3 (STO) thin films on silicon without any buffer layer, by means of pulsed laser deposition technique. The crystal structures of the grown films were examined by X-ray diffraction analysis including theta-2 theta scan and rocking curve as well as Laue diffraction methods. STO films with single (110) out-of-plane orientation were formed on all (100), (110) and (111)-oriented Si substrates. The in-plane alignments for the epitaxial STO films grown directly on Si (100) were found as STO[001]//Si[001] and STO[1 (1) over bar0]//Si[010]. The results should be of interest for better understanding of the growth of perovskite oxide thin films on silicon wafers.