A vortex diode is used as a highly reliable check-valve in nuclear applications, where it mainly benefits from the intrinsic properties of no moving parts and no leakage. Its basic principle is similar to the diode in an electric circuit. The typical structure of a vortex diode consists of a chamber with axial and tangential ports. When the fluid is injected through the axial port, a simple radial flow in the chamber leads to a relatively low flow resistance. On the other hand, in the reverse flow mode, a strongly swirling vortex can be set up in the chamber, resulting in a very high flow resistance. Several experimental studies found vortex-induced vibration of a vortex diode in the reverse flow mode, where it indicated that the flow was unstable in the vortex diode. This phenomenon may affect the reliability of the vortex diode. However, the mechanism has not been investigated systematically and profoundly. In this paper, 3-D simulations are carried out to help understand the related flow characteristics in the vortex diode. Standard k-epsilon model was selected for forward flow, while Reynolds stress model was selected for reverse flow. We have found that the results from transient simulations are in good agreement with experimental data. The transient simulations also capture the periodic pressure fluctuation in the vortex diode. Vortex diodes with different structures and geometrical parameters are simulated at different Reynolds number conditions. It is found that the characteristics of the pressure fluctuation are determined by the structure parameters and working conditions of the vortex diode. The flow instability is mainly caused by the asymmetry of the vortex diode. The work presented in this paper will be useful to give better understanding of flows in vortex diodes and to provide some guidance for optimizing the vortex diode.
