Characterization of short-range order in an amorphous Cd-Se-Te system by wide angle X-ray scattering(WAXS)

被引:4
作者
Fayek, SA [1 ]
El-Sayed, SM [1 ]
机构
[1] Natl Ctr Radiat Res & Technol, Cairo, Egypt
关键词
amorphous alloys; structural parameters; pair distribution function; coordination numbers;
D O I
10.1016/S0963-8695(03)00083-5
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Short-range orders of CdxSe70-xTe30 amorphous alloys of a chalcogenide system with 2 less than or equal to x less than or equal to 10 have been studied by wide-angle Xray scattering (WAXS). Once the hypotheses on the local order of the alloy had been formulated, the radial distribution function (RDF) analysis have make it possible to evaluate them referring specifically to the coordination of the atoms. The structural parameters such as atomic distance between the different possible pairs of atoms in each element J(r), the structure factor F(q), the pair distribution function G(r) and the coordination numbers for amorphous samples have been discussed. Moreover, in our system, under study, the average coordination numbers of the three different atoms involved and their distance to the first coordination sphere have been determined. However, the extraction of the inverse Fourier transforms to generated atomic distribution function has led us to a simulated reduced interference function Q(q). (C) 2003 Elsevier Ltd. All rights reserved.
引用
收藏
页码:619 / 623
页数:5
相关论文
共 14 条
[1]  
Betts F., 1970, Journal of Non-Crystalline Solids, V4, P554, DOI 10.1016/0022-3093(70)90093-1
[2]  
BURIAN A, 1997, J NONCRYST SOLIDS, V23, P212
[3]   RADIAL-DISTRIBUTION ANALYSIS OF AMORPHOUS AL0.23TE0.77 BY X-RAY-DIFFRACTION [J].
DANJOU, A ;
SANZ, F .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1978, 28 (03) :319-326
[4]   A study of band-bending and barrier height variation in thin film n-CdSe0.5Te0.5 photoanode/polysulphide junctions [J].
Das, VD ;
Damodare, L .
SOLID STATE COMMUNICATIONS, 1996, 99 (10) :723-728
[5]  
Dean A., 1992, LANGES HDB CHEM, V14th
[6]   MODELING OF THE SPATIAL STRUCTURE BY MEANS OF WIDE-ANGLE X-RAY-SCATTERING AND EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE FOR THE CU8AS26SE66 AND CU26AS37SE37 SEMICONDUCTOR ALLOYS [J].
GOMEZVELA, D ;
ESQUIVIAS, L ;
PRIETO, C .
PHYSICAL REVIEW B, 1993, 48 (14) :10110-10117
[7]  
KLUC HP, 1974, XRAY DIFFRACTION PRO
[8]   STRUCTURAL STUDY OF SEMICONDUCTING GLASSY ALLOY AS0.20SE0.30TE0.50 [J].
LIGERO, RA ;
CASASRUIZ, M ;
VAZQUEZ, J ;
VILLARES, P .
JOURNAL OF MATERIALS SCIENCE, 1992, 27 (04) :1001-1007
[9]  
NOBUO M, 2002, J CRYST GROWTH, V1550, P237
[10]  
Pauling L., 1969, UNIONES QUIMICAS