Spectroscopy with meV energy resolution

被引：43

作者：

Sinn, H ^{[1
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 2001年 / 13卷 / 34期

关键词：

D O I：

10.1088/0953-8984/13/34/305

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Inelastic x-ray scattering has become a powerful tool in condensed matter physics in recent years. This is due to the advent of the third-generation synchrotron radiation sources, which provide an intense and collimated x-ray beam, and due to improvements in x-ray optics. This article is an introduction to the basic principles of inelastic x-ray scattering with meV resolution. In particular the geometric and crystal contributions for monochromator and analyser crystals are discussed. Also, an estimation of phonon intensities, obtained with a meV spectrometer, is derived.

引用

页码：7525 / 7537

页数：13

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