共 36 条
- [1] A tensile test technique for the freestanding PMMA thin films [J]. CURRENT APPLIED PHYSICS, 2009, 9 : S107 - S109
- [3] Performance characterization of negative resists for sub-10-nm electron beam lithography [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2010, 28 (06): : C6C34 - C6C40
- [6] Chen CY, 2009, NAT NANOTECHNOL, V4, P861, DOI [10.1038/NNANO.2009.267, 10.1038/nnano.2009.267]