Magnetization-graded ferromagnets: The magnetic analogs of semiconductor junction elements

被引:36
作者
Mantese, JV
Micheli, AL
Schubring, NW
Hayes, RW
Srinivasan, G
Alpay, SP [1 ]
机构
[1] Univ Connecticut, Dept Mat Sci & Engn, Storrs, CT 06269 USA
[2] Univ Connecticut, Inst Mat Sci, Storrs, CT 06269 USA
[3] Oakland Univ, Dept Phys, Rochester, MI 48309 USA
[4] Delphi Res Labs, Shelby Township, MI 48315 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.2012526
中图分类号
O59 [应用物理学];
学科分类号
摘要
Compositionally graded ferrites are formed as the magnetic analogs of semiconductor junction devices. The internal, or the "built-in," magnetic field is intrinsic to the structure and is determined from ferromagnetic resonance microscopy. Magnetic analysis of a nickel-zinc-ferrite system in terms of its spatially dependent order parameter, the magnetization, yields a value for the internal magnetic field consistent with experimental observations. Our results are extended to the general class of ferroic and other "smart" materials via a spatially dependent free-energy potential. (c) 2005 American Institute of Physics.
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页数:3
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