Isolated SiC nanocrystals in SiO2 -: art. no. 253109

被引:25
作者
Makkai, Z [1 ]
Pécz, B
Bársony, I
Vida, G
Pongrácz, A
Josepovits, KV
Deák, P
机构
[1] Hungarian Acad Sci, Res Inst Tech Phys & Mat Sci, H-1525 Budapest, Hungary
[2] Budapest Univ Technol & Econ, H-1525 Budapest, Hungary
关键词
D O I
10.1063/1.1952577
中图分类号
O59 [应用物理学];
学科分类号
摘要
A simple method, compatible with conventional silicon technology, is introduced to generate SiC nanocrystals, embedded in SiO2 on Si, and aligned parallel with the interface. The nanometer-sized SiC grains were grown into SiO2 close to the Si/SiO2 interface by a two-step annealing of oxide covered Si: first in a CO, then in a pure O-2 atmosphere. The first (carbonization) step creates epitaxial SiC crystallites grown into the Si surface, while the second (oxidation) step moves the interface beyond them. Conventional and high-resolution cross-sectional electron microscopy shows pyramidal Si protrusions at the Si/SiO2 interface under the grains. The size of the grains, as well as their distance from the Si/SiO2 interface (peak of pyramids) can be controlled by the annealing process parameters. (c) 2005 American Institute of Physics.
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页码:1 / 3
页数:3
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