Effect of low angle grain boundaries on detection characteristics of trans-stilbene crystals

被引：9
作者：
Arulchakkaravarthi, A
Balamurugan, N
Kumar, R
Santhanaraghavan, P
Muralithar, S
Nagarajan, T
Ramasamy, P [1 ]
机构：
[1] Anna Univ, Ctr Crystal Growth, Madras 25, Tamil Nadu, India
[2] Ctr Nucl Sci, Delhi 67, India
[3] Natl Tsing Hua Univ, Tsinchu, Taiwan
来源：
MATERIALS LETTERS | 2004年 / 58卷 / 7-8期
关键词：
crystal growth; organic compounds; defect; scintillator; low angle grain boundary; vertical Bridgman Technique;
D O I：
10.1016/j.matlet.2003.08.036
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Crystals of trans-stilbene were grown by vertical Bridgman Technique and tested by X-ray rocking analysis. Low angle grain boundaries were identified for some crystals and they were tested for the performance of scintillation time characteristics. Their performance is compared with grain boundary-free crystals. (C) 2003 Published by Elsevier B.V.
引用
收藏
页码：1209 / 1211
页数：3
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