Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction

被引：144

作者：

Britton, T. B. ^{[1
]}

Wilkinson, A. J. ^{[1
]}

机构：

[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England

来源：

ULTRAMICROSCOPY | 2011年 / 111卷 / 08期

基金：

英国工程与自然科学研究理事会;

关键词：

EBSD; Electron backscatter diffraction; Scanning electron microscope; Copper; Strain; Deformation; ORIENTATION; ACCURACY;

D O I：

10.1016/j.ultramic.2011.05.007

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A set of dynamically simulated electron backscatter patterns (EBSPs) for alpha-Ti crystals progressively rotated by 1 degrees steps were analysed using cross-correlation to determine image shifts from which strains and rotations were calculated. At larger rotations the cross-correlation fails in certain regions of the EBSP where large shifts are generated. These incorrect shifts prevent standard least square error procedures from obtaining a valid solution for the strain and rotation, where the applied rotation exceeds similar to 8 degrees. Using a robust iterative fitting routine reliable strains and rotations can be obtained for applied rotations of up to and including similar to 11 degrees even though some image shifts are measured incorrectly. Finally, high resolution electron backscatter diffraction has been used to analyse the residual elastic strain, lattice rotations and density of stored geometrically necessary dislocations in a sample of copper deformed to 10% total strain. The robust iterative fitting analysis allows reliable analysis of a larger proportion of the map, the difference being most obviously beneficial in regions where significant lattice rotations have been generated. (c) 2011 Elsevier B.V. All rights reserved.

引用

页码：1395 / 1404

页数：10

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