Shape verification using dual-wavelength holographic interferometry

被引:8
作者
Bergstrom, Per [1 ]
Rosendahl, Sara [1 ]
Gren, Per [1 ]
Sjodahl, Mikael [1 ]
机构
[1] Lulea Univ Technol, Dept Engn Sci & Math, S-97187 Lulea, Sweden
关键词
computer vision; phase unwrapping; precision engineering; registration; PHASE-UNWRAPPING ALGORITHM; FORM SURFACE INSPECTION; PULSED TV HOLOGRAPHY; DIGITAL HOLOGRAPHY; REGISTRATION; CURVES; MODELS;
D O I
10.1117/1.3572182
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In automotive industry there is an interest of controlling the shape of a large number of identical components on-line in the manufacturing process. We propose a method to do this by capturing a digital hologram of the object and then using information from its computer aided design (CAD) model to calculate the shape and determine the agreement between the manufactured object and the CAD-model. The holographic recording of the object is done using dual wavelengths with a synthetic wavelength of approximately 400 mu m. The optical measurement results in a wrapped phase map with the phase values in the interval [-pi, pi]. Each phase interval represents a depth distance on the object of about 0.2 mm. The phase unwrapping is done iteratively using information from the CAD-model. This implies that it is possible to measure large discontinuities on the surface of the measured object. The method also gives a point-to-point correspondence between the measurement and the CAD-model which is vital for tolerance control. (C) 2011 Society of Photo-Optical Instrumentation Engineers (SPIE). [DOI: 10.1117/1.3572182]
引用
收藏
页数:7
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