Crystallization of Si Templates of Controlled Shape, Size, and Orientation: Toward Micro- and Nanosubstrates

被引:5
作者
Cohin, Yann [1 ,2 ]
Glas, Frank [2 ]
Cattoni, Andrea [2 ]
Bouchoule, Sophie [2 ]
Mauguin, Olivia [2 ]
Largeau, Ludovic [2 ]
Patriarche, Gilles [2 ]
Sondergard, Elin [1 ]
Harmand, Jean-Christophe [2 ]
机构
[1] St Gobain, Surface Verre & Interfaces, CNRS, UMR 125, F-93303 Aubervilliers, France
[2] CNRS, Lab Photon & Nanostruct, F-91460 Marcoussis, France
关键词
ALUMINUM-INDUCED CRYSTALLIZATION; AL-INDUCED CRYSTALLIZATION; INDUCED LAYER EXCHANGE; SILICON SOLAR-CELLS; THIN-FILM; AMORPHOUS-SILICON; TEMPERATURE; GLASS; PERFORMANCE; FABRICATION;
D O I
10.1021/cg5016548
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Fiber-textured polycrystalline silicon thin films have demonstrated their interest as seed layers for the epitaxial growth of high-quality materials on substrates such as glass or plastics. In the present work, we report a comprehensive study of the aluminum-induced crystallization (AIC) of isolated Si domains. Our study not only demonstrates the fabrication by AIC of shape- and size-controlled Si monocrystals at the nanoscale but also allows for the prediction of minimal annealing conditions for complete crystallization of such structures. These ultrathin [111]-oriented monocrystals are promising candidates as selected-area epitaxy substrates with both an easy control on the morphology of these structures and a low-temperature fabrication process.
引用
收藏
页码:2102 / 2109
页数:8
相关论文
共 43 条
  • [11] Her Y.-C., 2007, J APPL PHYS, P270
  • [12] Herd S. R., 1972, Journal of Non-Crystalline Solids, V7, P309, DOI 10.1016/0022-3093(72)90267-0
  • [13] Nucleation and growth kinetics during metal-induced layer exchange crystallization of Ge thin films at low temperatures
    Hu, Shu
    McIntyre, Paul C.
    [J]. JOURNAL OF APPLIED PHYSICS, 2012, 111 (04)
  • [14] Effect of grain size and dislocation density on the performance of thin film polycrystalline silicon solar cells
    Imaizumi, M
    Ito, T
    Yamaguchi, M
    Kaneko, K
    [J]. JOURNAL OF APPLIED PHYSICS, 1997, 81 (11) : 7635 - 7640
  • [15] Two-step crystallization during the reverse aluminum-induced layer exchange process
    Jaeger, C.
    Bator, M.
    Matich, S.
    Stutzmann, M.
    [J]. JOURNAL OF APPLIED PHYSICS, 2010, 108 (11)
  • [16] On the Controlling Mechanism of Preferential Orientation of Polycrystalline-Silicon Thin Films Grown by Aluminum-Induced Crystallization
    Jung, Mina
    Okada, Atsushi
    Saito, Takanobu
    Suemasu, Takashi
    Usami, Noritaka
    [J]. APPLIED PHYSICS EXPRESS, 2010, 3 (09)
  • [17] Silicon nanowire growth on poly-silicon-on-quartz substrates formed by aluminum-induced crystallization
    Kendrick, Chito
    Bomberger, Cory
    Dawley, Natalie
    Georgiev, Julie
    Shen, Haoting
    Redwing, Joan M.
    [J]. CRYSTAL RESEARCH AND TECHNOLOGY, 2013, 48 (09) : 658 - 665
  • [18] Al-Induced oriented-crystallization of Si films on quartz and its application to epitaxial template for Ge growth
    Kurosawa, Masashi
    Toko, Kaoru
    Kawabata, Naoyuki
    Sadoh, Taizoh
    Miyao, Masanobu
    [J]. SOLID-STATE ELECTRONICS, 2011, 60 (01) : 7 - 12
  • [19] Orientation-controlled Si thin films on insulating substrates by Al-induced crystallization combined with interfacial-oxide layer modulation
    Kurosawa, Masashi
    Kawabata, Naoyuki
    Sadoh, Taizoh
    Miyao, Masanobu
    [J]. APPLIED PHYSICS LETTERS, 2009, 95 (13)
  • [20] Silicon Nanowire Polytypes: Identification by Raman Spectroscopy, Generation Mechanism, and Misfit Strain in Homostructures
    Lopez, Francisco J.
    Givan, Uri
    Connell, Justin G.
    Lauhon, Lincoln J.
    [J]. ACS NANO, 2011, 5 (11) : 8958 - 8966