Elastic modulus of polyamide thin films formed by molecular layer deposition

被引:9
作者
McIntee, Olivia M. [1 ,2 ]
Welch, Brian C. [1 ,2 ]
Greenberg, Alan R. [1 ,2 ]
George, Steven M. [3 ]
Bright, Victor M. [1 ]
机构
[1] Univ Colorado, Dept Mech Engn, Boulder, CO 80309 USA
[2] Univ Colorado, Membrane Sci Engn & Technol MAST Ctr, Boulder, CO 80309 USA
[3] Univ Colorado, Dept Chem, Boulder, CO 80309 USA
基金
美国国家科学基金会;
关键词
Molecular layer deposition; Atomic force microscopy; Elastic modulus; Polyamide thin films; ATOMIC-FORCE MICROSCOPY; ULTRATHIN POLYMER-FILMS; YOUNGS MODULUS; AFM; MEMBRANES; CONTACT; DEFORMATION; STIFFNESS; STRENGTH; SURFACES;
D O I
10.1016/j.polymer.2022.125167
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Molecular layer deposition (MLD) is a gas-phase deposition technique that can create ultra-thin films with precisely controlled chemical composition and thickness by depositing one monolayer at a time. This makes MLD an attractive technology for desalination membranes among other applications. Given its relatively recent development, little information has been reported regarding the properties of MLD thin films. We present the results of an initial mechanical property study of MLD films with thicknesses ranging from similar to 50 to 2000 nm. MLD was utilized to create crosslinked polyamide films grown using either m-phenylenediamine (MPD) and trimesoyl chloride (TMC) reactants or piperazine (PIP) and TMC reactants. The elastic modulus of the films was determined using atomic force microscopy (AFM). The results show that the modulus was independent of film thickness with values of 4.36 +/- 1.19 GPa and 5.24 +/- 1.06 GPa for the MLD films grown using the MPD-TMC and PIP-TMC chemistries, respectively. These values are of the same order of magnitude as those reported for much thicker polyamide films, but higher than the modulus of polyamide films fabricated using interfacial polymerization.
引用
收藏
页数:6
相关论文
共 53 条
[1]   Influence of support-layer deformation on the intrinsic resistance of thin film composite membranes [J].
Aghajani, Masoud ;
Wang, Mengyuan ;
Cox, Lewis M. ;
Killgore, Jason P. ;
Greenberg, Alan R. ;
Ding, Yifu .
JOURNAL OF MEMBRANE SCIENCE, 2018, 567 :49-57
[2]   Relationship between permeation and deformation for porous membranes [J].
Aghajani, Masoud ;
Maruf, Sajjad H. ;
Wang, Mengyuan ;
Yoshimura, Joseph ;
Pichorim, Gabriel ;
Greenberg, Alan ;
Ding, Yifu .
JOURNAL OF MEMBRANE SCIENCE, 2017, 526 :293-300
[3]   Temperature- and thickness-dependent elastic moduli of polymer thin films [J].
Ao, Zhimin ;
Li, Sean .
NANOSCALE RESEARCH LETTERS, 2011, 6
[4]   Mechanical Properties of Ultrathin Polymer Nanocomposites [J].
Bay, R. Konane ;
Zarybnicka, Klara ;
Jancar, Josef ;
Crosby, Alfred J. .
ACS APPLIED POLYMER MATERIALS, 2020, 2 (06) :2220-2227
[5]   Molecular Layer Deposition on Carbon Nanotubes [J].
Brown, Joseph J. ;
Hall, Robert A. ;
Kladitis, Paul E. ;
George, Steven M. ;
Bright, Victor M. .
ACS NANO, 2013, 7 (09) :7812-7823
[6]   Thickness Dependence of the Young's Modulus of Polymer Thin Films [J].
Chang, Jooyoung ;
Toga, Kamil B. ;
Paulsen, Joseph D. ;
Menon, Narayanan ;
Russell, Thomas P. .
MACROMOLECULES, 2018, 51 (17) :6764-6770
[7]   From micro to nano: Polyamide thin film on microfiltration ceramic tubular membranes for nanofiltration [J].
Chong, Jeng Yi ;
Wang, Rong .
JOURNAL OF MEMBRANE SCIENCE, 2019, 587
[8]   Stiffness, Strength, and Ductility of Nanoscale Thin Films and Membranes: A Combined Wrinkling-Cracking Methodology [J].
Chung, Jun Young ;
Lee, Jung-Hyun ;
Beers, Kathryn L. ;
Stafford, Christopher M. .
NANO LETTERS, 2011, 11 (08) :3361-3365
[9]   Nanoscale control of internal inhomogeneity enhances water transport in desalination membranes [J].
Culp, Tyler E. ;
Khara, Biswajit ;
Brickey, Kaitlyn P. ;
Geitner, Michael ;
Zimudzi, Tawanda J. ;
Wilbur, Jeffrey D. ;
Jons, Steven D. ;
Roy, Abhishek ;
Paul, Mou ;
Ganapathysubramanian, Baskar ;
Zydney, Andrew L. ;
Kumar, Manish ;
Gomez, Enrique D. .
SCIENCE, 2021, 371 (6524) :72-75
[10]   Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy [J].
Du, BY ;
Tsui, OKC ;
Zhang, QL ;
He, TB .
LANGMUIR, 2001, 17 (11) :3286-3291