Estimation of current distribution within conductors by field measurements

In this paper, the current distribution in conductors is estimated from external magnetic field measured near the conductor surfaces. The inverse eddy current problem is formulated. The Sampled Pattern Matching (SPM) method has been used previously to solve inverse source and identification problems. Here, the same technique is extended to the inverse eddy current problems through the defining the governing equations for eddy current problem and using appropriate fundamental Green functions. The method is demonstrated by investigation of thin film transformer. The current distribution within thin film conductors from field measurements has been estimated at different mode and conditions of film transformer.